Use of Scattered Coincidences for Emission-Based Estimation of Attenuation Map in PET

Berker, Yannick; Kießling, Fabian; Schulz, Volkmar

Piscataway, NJ : IEEE Operations Center (2012)
Contribution to a book, Contribution to a conference proceedings

In: 2012 IEEE Nuclear Science Symposium and Medical Imaging Conference record, (NSS/MIC 2012) : Anaheim, California, USA, 27 October - 3 November 2012 ; [and the 19th Room-Temperature Semiconductor X-Ray and Gamma-Ray Detector Workshop] / [sponsored by: the Nuclear and Plasma Sciences Society of the Institute of Electrical and Electronic Engineers. Guest ed.: Bo Yu]
Page(s)/Article-Nr.: 2285-2287


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